Thermal-Aware Testing Of Digital Vlsi Circuits And Systems

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

• | Author: Santanu Chattopadhyay
• | Publisher: Crc Press
• | Publication Date: Apr 25, 2018
• | Number of Pages: 118 pages
• | Language: English
• | Binding: Hardcover/Computers
• | ISBN-10: 0815378823
• | ISBN-13: 9780815378822