Semiconductor Material and Device Characterization

Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.

• | Author: Dieter K. Schroder
• | Publisher: Wiley-IEEE Press
• | Publication Date: June 29, 2015
• | Number of Pages: 800 pages
• | Language: English
• | Binding: Hardcover
• | ISBN-10: 0471739065
• | ISBN-13: 9780471739067